Specification:
Measurement Range:1PPM--99.99%
Plating layer precision:0.005um
Measurement time :60--300seconds
Measurement substance:solid,powder,liquid
precision :0.05%
Analysis elements :from K to U
Detector :pin diode semiconductor detector
X-Ray generator voltage:0~50kV
Current:0~600mA
Relative humidity :
Measurement Range:1PPM--99.99%
Plating layer precision:0.005um
Measurement time :60--300seconds
Measurement substance:solid,powder,liquid
precision :0.05%
Analysis elements :from K to U
Detector :pin diode semiconductor detector
X-Ray generator voltage:0~50kV
Current:0~600mA
Relative humidity :
Features
.EDX8000 XRFMain Products
EDX, ICP, WDX series, XRF Spectrometer