Configuration:
Measurement Range:1PPM-99.99%
Plating layer precision:0.01um
Measurement time :60-300 seconds
Measurement substance: solid,powder.liquid
Precision :0.05%
Analysis range :Na-U
Detector :pin diode semiconductor detector
X-Ray generator voltage:0~50kV
Current:0~600mA
Relative humidity :
Measurement Range:1PPM-99.99%
Plating layer precision:0.01um
Measurement time :60-300 seconds
Measurement substance: solid,powder.liquid
Precision :0.05%
Analysis range :Na-U
Detector :pin diode semiconductor detector
X-Ray generator voltage:0~50kV
Current:0~600mA
Relative humidity :
Features
.EDX6000 XRFMain Products
EDX, ICP, WDX series, XRF Spectrometer